Patriot Burst Elite SSD and SMART

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TL;DR

Do not buy Patriot Burst Elite 1920GB if you expect normal SMART information.

If you have one and are looking for the SMART values, skip to the end.

Price / performance

So I started looking around for a large SSD with a good price/performance ratio. Then I found the Patriot Burst Elite 1920GB SSD from Patriot Memory. It has a 3 year warranty and 800 TB TBW (Total Bytes Written), for about 96,- euro (including shipping).

USB enclosure

It fits perfectly in my Orico transparent hard drive enclosure for 2.5 inch connected via USB to my Raspberry Pi.

The enclosure is seen via lsusb as such:

Bus 001 Device 004: ID 2109:0715 VIA Labs, Inc. VL817 SATA Adaptor

after a while I checked SMART

After a while of usage, I checked SMART to see how much life the SSD should have left. I was surprised about the output of smartctl, because it contained a lot of “Unknown Attributes” and no health or media wearout stats:

User Capacity:    1,920,383,410,176 bytes [1.92 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
TRIM Command:     Available, deterministic, zeroed
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Sun Feb 26 09:05:16 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x02) Offline data collection activity
										was completed without error.
										Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
										without error or no self-test has ever
										been run.
Total time to complete Offline
data collection:                (   33) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
										Auto Offline data collection on/off support.
										Suspend Offline collection upon new
										command.
										Offline surface scan supported.
										Self-test supported.
										Conveyance Self-test supported.
										Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
										power-saving mode.
										Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
										General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (   2) minutes.
Conveyance self-test routine
recommended polling time:        (   2) minutes.
SCT capabilities:              (0x0031) SCT Status supported.
										SCT Feature Control supported.
										SCT Data Table supported.

SMART Attributes Data Structure revision number: 20
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000a   100   100   000    Old_age   Always       -       0
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0007   100   100   050    Pre-fail  Always       -       0
  5 Reallocated_Sector_Ct   0x0013   100   100   050    Pre-fail  Always       -       0
  7 Unknown_SSD_Attribute   0x000b   100   100   050    Pre-fail  Always       -       0
  8 Unknown_SSD_Attribute   0x0005   100   100   050    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       1380
 10 Unknown_SSD_Attribute   0x0013   100   100   050    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0012   100   100   000    Old_age   Always       -       22
168 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
169 Unknown_Attribute       0x0013   099   099   010    Pre-fail  Always       -       1835064
171 Unknown_Attribute       0x0032   000   000   000    Old_age   Always       -       0
172 Unknown_Attribute       0x0032   000   000   000    Old_age   Always       -       0
173 Unknown_Attribute       0x0012   200   200   000    Old_age   Always       -       4295098369
175 Program_Fail_Count_Chip 0x0022   100   100   010    Old_age   Always       -       0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033   100   100   000    Pre-fail  Always       -       5732
187 Reported_Uncorrect      0x0032   100   000   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0012   100   100   000    Old_age   Always       -       22
194 Temperature_Celsius     0x0022   030   030   000    Old_age   Always       -       30 (Min/Max 10/48)
199 UDMA_CRC_Error_Count    0x0012   100   100   000    Old_age   Always       -       0
206 Unknown_SSD_Attribute   0x0032   200   200   000    Old_age   Always       -       1
207 Unknown_SSD_Attribute   0x0032   200   200   000    Old_age   Always       -       2
208 Unknown_SSD_Attribute   0x0032   200   200   000    Old_age   Always       -       1
209 Unknown_SSD_Attribute   0x0032   200   200   000    Old_age   Always       -       1
210 Unknown_Attribute       0x0032   200   200   000    Old_age   Always       -       16
211 Unknown_Attribute       0x0032   200   200   000    Old_age   Always       -       7
231 Unknown_SSD_Attribute   0x0023   100   100   005    Pre-fail  Always       -       0
241 Total_LBAs_Written      0x0032   100   100   000    Old_age   Always       -       422
242 Total_LBAs_Read         0x0032   100   100   000    Old_age   Always       -       5
245 Unknown_Attribute       0x0032   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
	1        0        0  Not_testing
	2        0        0  Not_testing
	3        0        0  Not_testing
	4        0        0  Not_testing
	5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

It is strange to see so many “Unknowns” in smartctl. Especially since I’m used to seeing actionable information there, especially about the health of the SSD. Since SSDs break (wearout) differently than old-skool hard drives, this is very important (essential actually) information to have.

support

So I contacted support via the website. They replied quickly and were nice. Of course they also referred me to Crystal Disk Info and I explained that I already provided the same information via smartctl, so they are very accustomed to Windows… After a couple of messages back and forth, the language quality of their messages dropped (I assume bad online translations). The support department really tried to help me out, but apparantly their “R&D department” will not release the SMART information and it is supposed to be ‘confidential’.

Crystal disk information

Crystal disk information (continued)

This baffled me, since checking the health of a product you bought, is not a weird thing to ask (as a customer). Especially since it is the defacto standard.

It also sounds like the support department has no say (or leverage) towards the R&D department. Claiming that SMART information is confidential, I call that bullsh*t.

The support department told me not to worry and their warranty remains intact. Yeah, sure, nice of them to restate that, but it is not a solution.

twitter (a.k.a. social media)

My last resort was to use their social media channel to try to get this solved somehow. So I posted a message on Twitter in the hope that Patriot Viper or Patriot Viper EU would reply.

my twitter post

Of course I did not get a response.

reverse engineering

Waiting for an SSD to break and effectively lose all the data, is unacceptable. So I did some reverse engineering and found the S.M.A.R.T. values for the SSDs. Enjoy!

general

1: "Read Error Rate"
2: "Throughput Performance"
3: "Spin Up Time"
4: "Start/Stop Count"
5: "Reallocated Sectors Count"
6: "Read Channel Margin"
7: "Seek Error Rate"
8: "Seek Time Performance"
9: "Power On Hours"
10: "Spin Retry Count"
11: "Recalibration Retries"
12: "Power Cycle Count"
13: "Soft Read Error Rate"
148: "Total SLC Erase Count"
149: "Maximum SLC Erase Count"
150: "Minimum SLC Erase Count"
151: "Average SLC Erase Count"
160: "Uncorrectable Sector Count On Line"
161: "Number of Pure Spare"
162: "Number of child pair"
163: "Number of Initial Invalid Block"
164: "Total Erase Count"
165: "Max Erase Count"
166: "Min Erase Count"
167: "Average Erase Count"
168: "Max Erase Count in Spec"
169: "Remain Life Percentage"
175: "Worst Die Program Fail Count"
176: "Worst Die Erase Fail Count"
177: "WearLeveling Count"
178: "Used Reserved Block Count"
179: "Used Reserved Block Count (Total)"
180: "Unused Reserved Block Count Total"
181: "Program Fail Count"
182: "Erase Fail Count"
183: "SATA Downshift Error Count or Runtime Bad Block"
184: "End-to-End error / IOEDC"
185: "Head Stability"
186: "Induced Op-Vibration Detection"
187: "Uncorrectable Error Count"
188: "Command Timeout"
189: "High Fly Writes"
190: "Airflow Temperature"
191: "G-sense Error Rate"
192: "Unexpected Power Loss Count"
193: "Load/Unload Cycle Count"
194: "Temperature"
195: "Hardware ECC Recovered"
196: "Reallocation Event Count"
197: "Current Pending Sector Count"
198: "Uncorrectable Sector Count Off Line"
199: "Ultra DMA CRC error count"
200: "Multi-Zone Error Rate"
201: "Soft Read Error Rate"
202: "Data Address Mark Errors"
203: "Run Out Cancel"
204: "Soft ECC Correction"
205: "Thermal Asperity Rate (TAR)"
206: "Flying Height"
207: "Spin High Current"
208: "Spin Buzz"
209: "Offline Seek Performance"
210: "Vibration During Write"
211: "Vibration During Write"
212: "Shock During Write"
220: "Disk Shift"
221: "G-Sense Error Rate"
222: "Loaded Hours"
223: "Load/Unload Retry Count"
224: "Load Friction"
225: "Host Writes"
226: "Load-in Time"
228: "Torque Amplification Count"
230: "GMR Head Amplitude"
231: "Temperature/SSD Life Left"
232: "Available Reserved Space"
233: "Power-On Hours/Media Wearout Indicator"
234: "Average erase count AND Maximum Erase Count"
235: "Good Block Count AND System(Free) Block Count"
240: "Head Flying Hours/Transfer Error Rate (Fujitsu)"
241: "Write Sector Count"
242: "Read Sector Count"
245: "Flash Write Count"
248: "ECC over threshold 1 count"
249: "ECC over threshold 2 count"
250: "Read Error Retry Rate"
251: "Static wear-leveling count"
252: "Data refresh count"
253: "Bad block count"
254: "Free Fall Protection"

PCIe SMI2260

0: "Critical Warning"
1: "Composite Temperature"
3: "Available Spare"
4: "Available Spare Threshold"
5: "Percentage Used"
32: "Data Units Read"
48: "Data Units Written"
64: "Host Read Commands"
80: "Host Write Commands"
96: "Controller Busy Time"
112: "Power Cycles"
128: "Power On Hours"
144: "Unsafe Shutdowns"
160: "Media and Data Integrity Errors"
176: "Number of Error Information Log Entries"
192: "Warning Composite Temperature Time"
196: "Critical Composite Temperature Time"
200: "Temperature Sensor 1"
202: "Temperature Sensor 2"
204: "Temperature Sensor 3"
206: "Temperature Sensor 4"
208: "Temperature Sensor 5"
210: "Temperature Sensor 6"
212: "Temperature Sensor 7"
214: "Temperature Sensor 8"
216: "Thermal Management Temperature 1 Transition Count"
220: "Thermal Management Temperature 2 Transition Count"
224: "Total Time For Thermal Management Temperature 1"
228: "Total Time For Thermal Management Temperature 2"

HyperStone (ECF)

2: "Throughput Performance"
196: "Reallocation Event Count"
199: "Ultra ATA CRC Error Rate"
203: "Total ECC Errors"
204: "Correctable ECC Errors"
229: "Supplier Spec"
232: "Total Number of Read Commands"

Hynix

1: "Read Error Rate"
2: "Throughput Performance"
3: "Spin Up Time"
4: "Start/Stop Count"
5: "Reallocated Sectors Count"
6: "Read Channel Margin"
7: "Seek Error Rate"
8: "Seek Time Performance"
9: "Power On Hours"
10: "Spin Retry Count"
11: "Recalibration Retries"
12: "Power Cycle Count"
13: "Soft Read Error Rate"
100: "Vendor Specific"
160: "Uncorrectable Sector Count On Line"
161: "Number of Pure Spare"
162: "Number of child pair"
163: "Number of Initial Invalid Block"
164: "Total Erase Count"
165: "Max Erase Count"
166: "Min Erase Count"
167: "Average Erase Count"
168: "Max Erase Count in Spec"
169: "Remain Life Percentage"
171: "Vendor Specific"
172: "Vendor Specific"
174: "Vendor Specific"
175: "Worst Die Program Fail Count"
176: "Worst Die Erase Fail Count"
177: "WearLeveling Count"
178: "Used Reserved Block Count"
179: "Used Reserved Block Count (Total)"
180: "Unused Reserved Block Count Total"
181: "Program Fail Count"
182: "Erase Fail Count"
183: "SATA Downshift Error Count or Runtime Bad Block"
184: "End-to-End error / IOEDC"
185: "Head Stability"
186: "Induced Op-Vibration Detection"
187: "Uncorrectable Error Count"
188: "Command Timeout"
189: "High Fly Writes"
190: "Airflow Temperature"
191: "G-sense Error Rate"
192: "Unexpected Power Loss Count"
193: "Load/Unload Cycle Count"
194: "Temperature"
195: "Hardware ECC Recovered"
196: "Reallocation Event Count"
197: "Current Pending Sector Count"
198: "Uncorrectable Sector Count Off Line"
199: "Ultra DMA CRC error count"
200: "Multi-Zone Error Rate"
201: "Soft Read Error Rate"
202: "Data Address Mark Errors"
203: "Run Out Cancel"
204: "Soft ECC Correction"
205: "Thermal Asperity Rate (TAR)"
206: "Flying Height"
207: "Spin High Current"
208: "Spin Buzz"
209: "Offline Seek Performance"
210: "Vibration During Write"
211: "Vibration During Write"
212: "Shock During Write"
220: "Disk Shift"
221: "G-Sense Error Rate"
222: "Loaded Hours"
223: "Load/Unload Retry Count"
224: "Load Friction"
225: "Host Writes"
226: "Load-in Time"
228: "Torque Amplification Count"
230: "GMR Head Amplitude"
231: "Temperature/SSD Life Left"
232: "Available Reserved Space"
233: "Power-On Hours/Media Wearout Indicator"
234: "Average erase count AND Maximum Erase Count"
235: "Good Block Count AND System(Free) Block Count"
240: "Head Flying Hours/Transfer Error Rate (Fujitsu)"
241: "Write Sector Count"
242: "Read Sector Count"
245: "Flash Write Count"
248: "ECC over threshold 1 count"
249: "ECC over threshold 2 count"
250: "Read Error Retry Rate"
251: "Static wear-leveling count"
252: "Data refresh count"
253: "Bad block count"
254: "Free Fall Protection"

HyperStone (CSS)

12: "Power On Count Attribute"
194: "Temperature Status Attribute"
196: "Spare Block Count Attribute"
199: "UDMA CRC Errors Attribute"
203: "Total ECC Errors Attribute"
204: "Correctable ECC Errors Attribute"
213: "Spare Block Count Worst Chip Attribute"
214: "Anchor Block Status Attribute"
215: "Trim Status Attribute"
229: "Erase Block Count Attribute"
232: "Total Number of Reads Attribute"
241: "Total LBAs Written Attribute"
242: "Total LBAs Read Attribute"

SiliconMotion (CSS)

1: "Read Error Rate"
2: "Throughput Performance"
3: "Spin Up Time"
4: "Start/Stop Count"
5: "Reallocated Sectors Count"
6: "Read Channel Margin"
7: "Seek Error Rate"
8: "Seek Time Performance"
9: "Power On Hours"
10: "Spin Retry Count"
11: "Recalibration Retries"
12: "Power Cycle Count"
13: "Soft Read Error Rate"
160: "Uncorrectable Sector Count On Line"
161: "Number of Pure Spare"
162: "Number of child pair"
163: "Number of Initial Invalid Block"
164: "Total Erase Count"
165: "Max Erase Count"
166: "Min Erase Count"
167: "Average Erase Count"
168: "Max Erase Count in Spec"
169: "Remain Life Percentage"
175: "Worst Die Program Fail Count"
176: "Worst Die Erase Fail Count"
177: "WearLeveling Count"
178: "Used Reserved Block Count"
179: "Used Reserved Block Count (Total)"
180: "Unused Reserved Block Count Total"
181: "Program Fail Count"
182: "Erase Fail Count"
183: "SATA Downshift Error Count or Runtime Bad Block"
184: "End-to-End error / IOEDC"
185: "Head Stability"
186: "Induced Op-Vibration Detection"
187: "Uncorrectable Error Count"
188: "Command Timeout"
189: "High Fly Writes"
190: "Airflow Temperature"
191: "G-sense Error Rate"
192: "Power off Retract Count"
193: "Load/Unload Cycle Count"
194: "Temperature"
195: "Hardware ECC Recovered"
196: "Reallocation Event Count"
197: "Current Pending Sector Count"
198: "Uncorrectable Sector Count Off Line"
199: "Ultra DMA CRC error count"
200: "Multi-Zone Error Rate"
201: "Soft Read Error Rate"
202: "Data Address Mark Errors"
203: "Run Out Cancel"
204: "Soft ECC Correction"
205: "Thermal Asperity Rate (TAR)"
206: "Flying Height"
207: "Spin High Current"
208: "Spin Buzz"
209: "Offline Seek Performance"
210: "Vibration During Write"
211: "Vibration During Write"
212: "Shock During Write"
220: "Disk Shift"
221: "G-Sense Error Rate"
222: "Loaded Hours"
223: "Load/Unload Retry Count"
224: "Load Friction"
225: "Host Writes"
226: "Load-in Time"
228: "Torque Amplification Count"
230: "GMR Head Amplitude"
231: "Temperature/SSD Life Left"
232: "Available Reserved Space"
233: "Power-On Hours/Media Wearout Indicator"
234: "Average erase count AND Maximum Erase Count"
235: "Good Block Count AND System(Free) Block Count"
240: "Head Flying Hours/Transfer Error Rate (Fujitsu)"
241: "Write Sector Count"
242: "Read Sector Count"
245: "Flash Write Count"
248: "ECC over threshold 1 count"
249: "ECC over threshold 2 count"
250: "Read Error Retry Rate"
251: "Static wear-leveling count"
252: "Data refresh count"
253: "Bad block count"
254: "Free Fall Protection"